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Effect of substrate temperature on electrical, structural, optical and cathodoluminescent properties of In2O3-Sn thin films prepared by spray pyrolysis

Identifieur interne : 00B851 ( Main/Repository ); précédent : 00B850; suivant : 00B852

Effect of substrate temperature on electrical, structural, optical and cathodoluminescent properties of In2O3-Sn thin films prepared by spray pyrolysis

Auteurs : RBID : Pascal:04-0531399

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English descriptors

Abstract

Tin doped indium oxide thin films In2O3-Sn, have been deposited on glass substrate at various temperatures (723, 748 and 773K), using spray pyrolysis techniques. The optimal substrate temperature to obtain films of high crystallographic quality was 773K. For this temperature, the electrical resistivity is in the order of 3×10-4 Ω cm and the average optical transmission in the visible region is larger than 95%. The films were polycrystalline, crystallize in a cubic structure of the bixbyite Mn2O3 (I) type, and are preferentially orientated along the (400) direction. The cathodoluminescence spectra of In2O3-Sn thin films taken at room temperature, present two emission peaks, the first one at 410 nm corresponding to indirect band gap emission and the second one at 650 nm is related to oxygen deficiencies acting as defects.

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Pascal:04-0531399

Le document en format XML

<record>
<TEI>
<teiHeader>
<fileDesc>
<titleStmt>
<title xml:lang="en" level="a">Effect of substrate temperature on electrical, structural, optical and cathodoluminescent properties of In
<sub>2</sub>
O
<sub>3</sub>
-Sn thin films prepared by spray pyrolysis</title>
<author>
<name sortKey="El Hichou, A" uniqKey="El Hichou A">A. El Hichou</name>
<affiliation wicri:level="1">
<inist:fA14 i1="01">
<s1>Groupe d'étude des matériaux optoélectronique, Faculté des Sciences et techniques, Gueliz-marrakech, B. P. 618</s1>
<s2>Marrakech</s2>
<s3>MAR</s3>
<sZ>1 aut.</sZ>
</inist:fA14>
<country>Maroc</country>
<wicri:noRegion>Marrakech</wicri:noRegion>
</affiliation>
<affiliation wicri:level="3">
<inist:fA14 i1="02">
<s1>Université de Reims, UFR Sciences, UTAP-LMET UPRES EA 2061, 21 rue Clément Ader</s1>
<s2>51685 Reims</s2>
<s3>FRA</s3>
<sZ>1 aut.</sZ>
<sZ>3 aut.</sZ>
<sZ>5 aut.</sZ>
<sZ>6 aut.</sZ>
</inist:fA14>
<country>France</country>
<placeName>
<region type="region" nuts="2">Champagne-Ardenne</region>
<settlement type="city">Reims</settlement>
</placeName>
</affiliation>
</author>
<author>
<name sortKey="Kachouane, A" uniqKey="Kachouane A">A. Kachouane</name>
<affiliation wicri:level="1">
<inist:fA14 i1="03">
<s1>Université Ibn Tofail, Lab. d'optoélectronique et de physico-chimie des matériaux, Faculté des sciences, B. P. 133</s1>
<s2>Kenitra</s2>
<s3>MAR</s3>
<sZ>2 aut.</sZ>
<sZ>4 aut.</sZ>
<sZ>7 aut.</sZ>
</inist:fA14>
<country>Maroc</country>
<wicri:noRegion>Kenitra</wicri:noRegion>
</affiliation>
</author>
<author>
<name sortKey="Bubendorff, J L" uniqKey="Bubendorff J">J. L. Bubendorff</name>
<affiliation wicri:level="3">
<inist:fA14 i1="02">
<s1>Université de Reims, UFR Sciences, UTAP-LMET UPRES EA 2061, 21 rue Clément Ader</s1>
<s2>51685 Reims</s2>
<s3>FRA</s3>
<sZ>1 aut.</sZ>
<sZ>3 aut.</sZ>
<sZ>5 aut.</sZ>
<sZ>6 aut.</sZ>
</inist:fA14>
<country>France</country>
<placeName>
<region type="region" nuts="2">Champagne-Ardenne</region>
<settlement type="city">Reims</settlement>
</placeName>
</affiliation>
</author>
<author>
<name sortKey="Addou, M" uniqKey="Addou M">M. Addou</name>
<affiliation wicri:level="1">
<inist:fA14 i1="03">
<s1>Université Ibn Tofail, Lab. d'optoélectronique et de physico-chimie des matériaux, Faculté des sciences, B. P. 133</s1>
<s2>Kenitra</s2>
<s3>MAR</s3>
<sZ>2 aut.</sZ>
<sZ>4 aut.</sZ>
<sZ>7 aut.</sZ>
</inist:fA14>
<country>Maroc</country>
<wicri:noRegion>Kenitra</wicri:noRegion>
</affiliation>
</author>
<author>
<name sortKey="Ebothe, J" uniqKey="Ebothe J">J. Ebothe</name>
<affiliation wicri:level="3">
<inist:fA14 i1="02">
<s1>Université de Reims, UFR Sciences, UTAP-LMET UPRES EA 2061, 21 rue Clément Ader</s1>
<s2>51685 Reims</s2>
<s3>FRA</s3>
<sZ>1 aut.</sZ>
<sZ>3 aut.</sZ>
<sZ>5 aut.</sZ>
<sZ>6 aut.</sZ>
</inist:fA14>
<country>France</country>
<placeName>
<region type="region" nuts="2">Champagne-Ardenne</region>
<settlement type="city">Reims</settlement>
</placeName>
</affiliation>
</author>
<author>
<name sortKey="Troyon, M" uniqKey="Troyon M">M. Troyon</name>
<affiliation wicri:level="3">
<inist:fA14 i1="02">
<s1>Université de Reims, UFR Sciences, UTAP-LMET UPRES EA 2061, 21 rue Clément Ader</s1>
<s2>51685 Reims</s2>
<s3>FRA</s3>
<sZ>1 aut.</sZ>
<sZ>3 aut.</sZ>
<sZ>5 aut.</sZ>
<sZ>6 aut.</sZ>
</inist:fA14>
<country>France</country>
<placeName>
<region type="region" nuts="2">Champagne-Ardenne</region>
<settlement type="city">Reims</settlement>
</placeName>
</affiliation>
</author>
<author>
<name sortKey="Bougrine, A" uniqKey="Bougrine A">A. Bougrine</name>
<affiliation wicri:level="1">
<inist:fA14 i1="03">
<s1>Université Ibn Tofail, Lab. d'optoélectronique et de physico-chimie des matériaux, Faculté des sciences, B. P. 133</s1>
<s2>Kenitra</s2>
<s3>MAR</s3>
<sZ>2 aut.</sZ>
<sZ>4 aut.</sZ>
<sZ>7 aut.</sZ>
</inist:fA14>
<country>Maroc</country>
<wicri:noRegion>Kenitra</wicri:noRegion>
</affiliation>
</author>
</titleStmt>
<publicationStmt>
<idno type="inist">04-0531399</idno>
<date when="2004">2004</date>
<idno type="stanalyst">PASCAL 04-0531399 INIST</idno>
<idno type="RBID">Pascal:04-0531399</idno>
<idno type="wicri:Area/Main/Corpus">00AD91</idno>
<idno type="wicri:Area/Main/Repository">00B851</idno>
</publicationStmt>
<seriesStmt>
<idno type="ISSN">0040-6090</idno>
<title level="j" type="abbreviated">Thin solid films</title>
<title level="j" type="main">Thin solid films</title>
</seriesStmt>
</fileDesc>
<profileDesc>
<textClass>
<keywords scheme="KwdEn" xml:lang="en">
<term>Alcoholic solution</term>
<term>Binary compounds</term>
<term>Cathodoluminescence</term>
<term>Crystal growth from solutions</term>
<term>Doping</term>
<term>Electrical conductivity</term>
<term>Experimental study</term>
<term>Indium oxides</term>
<term>Polycrystals</term>
<term>Preferred orientation</term>
<term>Pyrolysis</term>
<term>Quantity ratio</term>
<term>Scanning electron microscopy</term>
<term>Spray coatings</term>
<term>Thin films</term>
<term>Tin additions</term>
<term>XRD</term>
</keywords>
<keywords scheme="Pascal" xml:lang="fr">
<term>Etude expérimentale</term>
<term>Cathodoluminescence</term>
<term>Conductivité électrique</term>
<term>Dopage</term>
<term>Addition étain</term>
<term>Croissance cristalline en solution</term>
<term>Dépôt projection</term>
<term>Pyrolyse</term>
<term>Solution alcoolique</term>
<term>Diffraction RX</term>
<term>Microscopie électronique balayage</term>
<term>Orientation préférentielle</term>
<term>Effet concentration</term>
<term>Polycristal</term>
<term>Indium oxyde</term>
<term>Composé binaire</term>
<term>Couche mince</term>
<term>In2O3</term>
<term>In O</term>
<term>Substrat verre</term>
<term>7860H</term>
<term>8115R</term>
</keywords>
<keywords scheme="Wicri" type="concept" xml:lang="fr">
<term>Dopage</term>
</keywords>
</textClass>
</profileDesc>
</teiHeader>
<front>
<div type="abstract" xml:lang="en">Tin doped indium oxide thin films In
<sub>2</sub>
O
<sub>3</sub>
-Sn, have been deposited on glass substrate at various temperatures (723, 748 and 773K), using spray pyrolysis techniques. The optimal substrate temperature to obtain films of high crystallographic quality was 773K. For this temperature, the electrical resistivity is in the order of 3×10
<sup>-4</sup>
Ω cm and the average optical transmission in the visible region is larger than 95%. The films were polycrystalline, crystallize in a cubic structure of the bixbyite Mn
<sub>2</sub>
O
<sub>3</sub>
(I) type, and are preferentially orientated along the (400) direction. The cathodoluminescence spectra of In
<sub>2</sub>
O
<sub>3</sub>
-Sn thin films taken at room temperature, present two emission peaks, the first one at 410 nm corresponding to indirect band gap emission and the second one at 650 nm is related to oxygen deficiencies acting as defects.</div>
</front>
</TEI>
<inist>
<standard h6="B">
<pA>
<fA01 i1="01" i2="1">
<s0>0040-6090</s0>
</fA01>
<fA02 i1="01">
<s0>THSFAP</s0>
</fA02>
<fA03 i2="1">
<s0>Thin solid films</s0>
</fA03>
<fA05>
<s2>458</s2>
</fA05>
<fA06>
<s2>1-2</s2>
</fA06>
<fA08 i1="01" i2="1" l="ENG">
<s1>Effect of substrate temperature on electrical, structural, optical and cathodoluminescent properties of In
<sub>2</sub>
O
<sub>3</sub>
-Sn thin films prepared by spray pyrolysis</s1>
</fA08>
<fA11 i1="01" i2="1">
<s1>EL HICHOU (A.)</s1>
</fA11>
<fA11 i1="02" i2="1">
<s1>KACHOUANE (A.)</s1>
</fA11>
<fA11 i1="03" i2="1">
<s1>BUBENDORFF (J. L.)</s1>
</fA11>
<fA11 i1="04" i2="1">
<s1>ADDOU (M.)</s1>
</fA11>
<fA11 i1="05" i2="1">
<s1>EBOTHE (J.)</s1>
</fA11>
<fA11 i1="06" i2="1">
<s1>TROYON (M.)</s1>
</fA11>
<fA11 i1="07" i2="1">
<s1>BOUGRINE (A.)</s1>
</fA11>
<fA14 i1="01">
<s1>Groupe d'étude des matériaux optoélectronique, Faculté des Sciences et techniques, Gueliz-marrakech, B. P. 618</s1>
<s2>Marrakech</s2>
<s3>MAR</s3>
<sZ>1 aut.</sZ>
</fA14>
<fA14 i1="02">
<s1>Université de Reims, UFR Sciences, UTAP-LMET UPRES EA 2061, 21 rue Clément Ader</s1>
<s2>51685 Reims</s2>
<s3>FRA</s3>
<sZ>1 aut.</sZ>
<sZ>3 aut.</sZ>
<sZ>5 aut.</sZ>
<sZ>6 aut.</sZ>
</fA14>
<fA14 i1="03">
<s1>Université Ibn Tofail, Lab. d'optoélectronique et de physico-chimie des matériaux, Faculté des sciences, B. P. 133</s1>
<s2>Kenitra</s2>
<s3>MAR</s3>
<sZ>2 aut.</sZ>
<sZ>4 aut.</sZ>
<sZ>7 aut.</sZ>
</fA14>
<fA20>
<s1>263-268</s1>
</fA20>
<fA21>
<s1>2004</s1>
</fA21>
<fA23 i1="01">
<s0>ENG</s0>
</fA23>
<fA43 i1="01">
<s1>INIST</s1>
<s2>13597</s2>
<s5>354000112030810420</s5>
</fA43>
<fA44>
<s0>0000</s0>
<s1>© 2004 INIST-CNRS. All rights reserved.</s1>
</fA44>
<fA45>
<s0>40 ref.</s0>
</fA45>
<fA47 i1="01" i2="1">
<s0>04-0531399</s0>
</fA47>
<fA60>
<s1>P</s1>
</fA60>
<fA61>
<s0>A</s0>
</fA61>
<fA64 i1="01" i2="1">
<s0>Thin solid films</s0>
</fA64>
<fA66 i1="01">
<s0>CHE</s0>
</fA66>
<fC01 i1="01" l="ENG">
<s0>Tin doped indium oxide thin films In
<sub>2</sub>
O
<sub>3</sub>
-Sn, have been deposited on glass substrate at various temperatures (723, 748 and 773K), using spray pyrolysis techniques. The optimal substrate temperature to obtain films of high crystallographic quality was 773K. For this temperature, the electrical resistivity is in the order of 3×10
<sup>-4</sup>
Ω cm and the average optical transmission in the visible region is larger than 95%. The films were polycrystalline, crystallize in a cubic structure of the bixbyite Mn
<sub>2</sub>
O
<sub>3</sub>
(I) type, and are preferentially orientated along the (400) direction. The cathodoluminescence spectra of In
<sub>2</sub>
O
<sub>3</sub>
-Sn thin films taken at room temperature, present two emission peaks, the first one at 410 nm corresponding to indirect band gap emission and the second one at 650 nm is related to oxygen deficiencies acting as defects.</s0>
</fC01>
<fC02 i1="01" i2="3">
<s0>001B70H60H</s0>
</fC02>
<fC02 i1="02" i2="3">
<s0>001B80A15R</s0>
</fC02>
<fC03 i1="01" i2="3" l="FRE">
<s0>Etude expérimentale</s0>
<s5>02</s5>
</fC03>
<fC03 i1="01" i2="3" l="ENG">
<s0>Experimental study</s0>
<s5>02</s5>
</fC03>
<fC03 i1="02" i2="3" l="FRE">
<s0>Cathodoluminescence</s0>
<s5>03</s5>
</fC03>
<fC03 i1="02" i2="3" l="ENG">
<s0>Cathodoluminescence</s0>
<s5>03</s5>
</fC03>
<fC03 i1="03" i2="3" l="FRE">
<s0>Conductivité électrique</s0>
<s5>04</s5>
</fC03>
<fC03 i1="03" i2="3" l="ENG">
<s0>Electrical conductivity</s0>
<s5>04</s5>
</fC03>
<fC03 i1="04" i2="X" l="FRE">
<s0>Dopage</s0>
<s5>05</s5>
</fC03>
<fC03 i1="04" i2="X" l="ENG">
<s0>Doping</s0>
<s5>05</s5>
</fC03>
<fC03 i1="04" i2="X" l="SPA">
<s0>Doping</s0>
<s5>05</s5>
</fC03>
<fC03 i1="05" i2="3" l="FRE">
<s0>Addition étain</s0>
<s5>06</s5>
</fC03>
<fC03 i1="05" i2="3" l="ENG">
<s0>Tin additions</s0>
<s5>06</s5>
</fC03>
<fC03 i1="06" i2="3" l="FRE">
<s0>Croissance cristalline en solution</s0>
<s5>07</s5>
</fC03>
<fC03 i1="06" i2="3" l="ENG">
<s0>Crystal growth from solutions</s0>
<s5>07</s5>
</fC03>
<fC03 i1="07" i2="3" l="FRE">
<s0>Dépôt projection</s0>
<s5>08</s5>
</fC03>
<fC03 i1="07" i2="3" l="ENG">
<s0>Spray coatings</s0>
<s5>08</s5>
</fC03>
<fC03 i1="08" i2="3" l="FRE">
<s0>Pyrolyse</s0>
<s5>09</s5>
</fC03>
<fC03 i1="08" i2="3" l="ENG">
<s0>Pyrolysis</s0>
<s5>09</s5>
</fC03>
<fC03 i1="09" i2="X" l="FRE">
<s0>Solution alcoolique</s0>
<s5>10</s5>
</fC03>
<fC03 i1="09" i2="X" l="ENG">
<s0>Alcoholic solution</s0>
<s5>10</s5>
</fC03>
<fC03 i1="09" i2="X" l="SPA">
<s0>Solución alcohólica</s0>
<s5>10</s5>
</fC03>
<fC03 i1="10" i2="3" l="FRE">
<s0>Diffraction RX</s0>
<s5>11</s5>
</fC03>
<fC03 i1="10" i2="3" l="ENG">
<s0>XRD</s0>
<s5>11</s5>
</fC03>
<fC03 i1="11" i2="3" l="FRE">
<s0>Microscopie électronique balayage</s0>
<s5>12</s5>
</fC03>
<fC03 i1="11" i2="3" l="ENG">
<s0>Scanning electron microscopy</s0>
<s5>12</s5>
</fC03>
<fC03 i1="12" i2="X" l="FRE">
<s0>Orientation préférentielle</s0>
<s5>13</s5>
</fC03>
<fC03 i1="12" i2="X" l="ENG">
<s0>Preferred orientation</s0>
<s5>13</s5>
</fC03>
<fC03 i1="12" i2="X" l="SPA">
<s0>Orientación preferencial</s0>
<s5>13</s5>
</fC03>
<fC03 i1="13" i2="3" l="FRE">
<s0>Effet concentration</s0>
<s5>14</s5>
</fC03>
<fC03 i1="13" i2="3" l="ENG">
<s0>Quantity ratio</s0>
<s5>14</s5>
</fC03>
<fC03 i1="14" i2="3" l="FRE">
<s0>Polycristal</s0>
<s5>15</s5>
</fC03>
<fC03 i1="14" i2="3" l="ENG">
<s0>Polycrystals</s0>
<s5>15</s5>
</fC03>
<fC03 i1="15" i2="3" l="FRE">
<s0>Indium oxyde</s0>
<s2>NK</s2>
<s5>16</s5>
</fC03>
<fC03 i1="15" i2="3" l="ENG">
<s0>Indium oxides</s0>
<s2>NK</s2>
<s5>16</s5>
</fC03>
<fC03 i1="16" i2="3" l="FRE">
<s0>Composé binaire</s0>
<s5>17</s5>
</fC03>
<fC03 i1="16" i2="3" l="ENG">
<s0>Binary compounds</s0>
<s5>17</s5>
</fC03>
<fC03 i1="17" i2="3" l="FRE">
<s0>Couche mince</s0>
<s5>18</s5>
</fC03>
<fC03 i1="17" i2="3" l="ENG">
<s0>Thin films</s0>
<s5>18</s5>
</fC03>
<fC03 i1="18" i2="3" l="FRE">
<s0>In2O3</s0>
<s4>INC</s4>
<s5>52</s5>
</fC03>
<fC03 i1="19" i2="3" l="FRE">
<s0>In O</s0>
<s4>INC</s4>
<s5>53</s5>
</fC03>
<fC03 i1="20" i2="3" l="FRE">
<s0>Substrat verre</s0>
<s4>INC</s4>
<s5>54</s5>
</fC03>
<fC03 i1="21" i2="3" l="FRE">
<s0>7860H</s0>
<s2>PAC</s2>
<s4>INC</s4>
<s5>56</s5>
</fC03>
<fC03 i1="22" i2="3" l="FRE">
<s0>8115R</s0>
<s2>PAC</s2>
<s4>INC</s4>
<s5>57</s5>
</fC03>
<fC07 i1="01" i2="3" l="FRE">
<s0>Composé minéral</s0>
<s5>48</s5>
</fC07>
<fC07 i1="01" i2="3" l="ENG">
<s0>Inorganic compounds</s0>
<s5>48</s5>
</fC07>
<fN21>
<s1>299</s1>
</fN21>
<fN44 i1="01">
<s1>PSI</s1>
</fN44>
<fN82>
<s1>PSI</s1>
</fN82>
</pA>
</standard>
</inist>
</record>

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